The Transparent Nucleus: SRC and single nucleon knockout inverse kinematics measurements using a 48 GeV/c carbon beam at JINR

Eli Piasetzky, Tel Aviv University

Dear Colleagues,

On behalf of BIAMS2020 Organizing Committee, we encourage you to participate in the 15th International Conference "Beam Injection Assessment of Microstructures in Semiconductors", which will be held on the 19-24 July, 2020 in Saint Petersburg, Russia.


We inform you that the abstract submission is already opened. The detailed information is available in the personal account on the website of the Conference, The registration is required.


We also have the pleasure to announce the Organizing Fee.


BIAMS2020 Conference acts as a forum for interaction between physicists, materials scientists and technologists; it gathers scientists from all over the world to present advances in the field of the physical characterization of semiconductors by means of beam injection and related methods. To learn more about the details please visit our website, where the data will be continuously updated. We encourage you to register for this event at your earliest convenience.


Looking forward to seeing you in Saint Petersburg.


Professor Maria Zamoryanskaya, Chairman


The Local Organizing Committee.



email: This email address is being protected from spambots. You need JavaScript enabled to view it.

tel: +7(931)-346-77-43

Netosis and application of microscopy methods in the study of cell death

Pleskova Svetlana - Professor, Department of Nanotechnology and Biotechnology

(Nizhny Novgorod State Technical University n.a. R.E. Alekseev)



Meeting agenda:

 Discussion of works submitted for the 2020 FLNP Competition in the section «Scientific-technical applied research»

Superwetting phenomenon: experimental results and possible mechanisms

N.A. Ivanova

(Institute X-BIO, University of Tyumen, Tyumen)